Nikon Announces MCT225 Metrology CT Set

Nikon Announces MCT225 Metrology CT SetBy way of DE Editors

Nikon Metrology’s fresh Metrology CT pattern, MCT225, provides Metrology CT on a ample reach of swatch sizes and information densities with 9+ L/50 m earmark uncovering.

High-precision bilinear guideways accoutered with high-resolution optic encoders are misprint rectified in the laser interferometer drawing techniques working in support of CMMs. In behalf of greatest exactitude and great phrase constancy, bounded fundamental study (FEA) was worn midst the conceive of state to modify the firmness of the operator.

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